Microstructure of SiC Whiskers with Different Cross-sections Perpendicular to the Whiskers Axis

【摘要】：正 Microstructure of β-SiC whiskers with differ-ent cross-sections perpendicular to their growingdirection was studied in detail by transmission elec-tron microscopy (TEM).It was indicated that therewere three types of cross-sections:round,hexagonal and trigonal.The whiskers with roundand hexagonal cross-sections had a high density ofplanar faults lying on the (111) close packed planesperpendicular to the whisker axis.There existed afew stacking faults on the other {111} planes insome hexagonal whiskers.The whiskers withbicrystals were also found in hexagonal whiskers.The microstructure of trigonal SiC whiskers wasbasically perfect but there were a few intrinsic stack-ing faults on the (11) planes (mostly) and (111)planes.The characters of electron diffraction pat-terns of β-SiC whiskers with different cross-sec-tions were reasonably analyzed using a reciprocalspace model with continuous diffraction streaksalong the [111] reciprocal direction.